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Volumn , Issue , 2002, Pages 291-299

Arc flash energy limitations using low-voltage circuit breakers

Author keywords

Arc flash; Circuit breaker; Flash protection boundary; Incident energy

Indexed keywords

ACCIDENT PREVENTION; ELECTRIC CIRCUIT BREAKERS; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC FAULT CURRENTS; OVERCURRENT PROTECTION;

EID: 0036443118     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (9)
  • 2
    • 0011839959 scopus 로고    scopus 로고
    • IEEE Draft Std 1584; IEEE web site
    • IEEE Draft Std 1584, Arc Flash Hazard Calculations, IEEE web site: http://grouper.ieee.org/groups/1584/index.html
    • Arc Flash Hazard Calculations
  • 3
    • 0020125421 scopus 로고
    • The other electrical hazard: Electric arc blast burns
    • May/June
    • R. H. Lee, "The other Electrical Hazard: Electric Arc Blast Burns," IEEE Transactions on Industry Applications, Vol. 1A-18, No. 3, May/June 1982, pp 246-251.
    • (1982) IEEE Transactions on Industry Applications , vol.1A-18 , Issue.3 , pp. 246-251
    • Lee, R.H.1
  • 5
    • 0033875952 scopus 로고    scopus 로고
    • Predicting incident energy to better manage the electric arc hazard on 600 V power distribution systems
    • Jan/Feb
    • R. L. Doughty, T. E. Neal, and H. L. Floyd II, "Predicting incident energy to better manage the electric arc hazard on 600 V power distribution systems," IEEE Transactions on Industry Applications, Vol. 36, No. 1, Jan/Feb 2000.
    • (2000) IEEE Transactions on Industry Applications , vol.36 , Issue.1
    • Doughty, R.L.1    Neal, T.E.2    Floyd H.L. II3
  • 7
    • 0011834527 scopus 로고    scopus 로고
    • Institute of Electrical and Electronic Engineers, New York
    • ANSI/IEEE Standard 241 - 1990 (Gray Book), Institute of Electrical and Electronic Engineers, New York.
    • ANSI/IEEE Standard 241 - 1990 (Gray Book)
  • 8
    • 0011882007 scopus 로고    scopus 로고
    • Institute of Electrical and Electronic Engineers, New York
    • ANSI/IEEE Standard 242 - 2001 (Buff Book), Institute of Electrical and Electronic Engineers, New York.
    • ANSI/IEEE Standard 242 - 2001 (Buff Book)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.