PMMA polymer film characterization using thickness-shear mode (TSM) quartz resonator

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn , Issue , 2002, Pages 294-300

  Morray, Boima ^a   Li, Suiqiong ^b   Hossenlopp, Jeanne ^c   Cernosek, Richard ^b   Josse, Fabien ^a  

^a Marquette University   (United States)

^b AUBURN UNIVERSITY   (United States)

^c Marquette University   (United States)

Author keywords

Complex modulus of polymers; Polymer film characterization; TSM resonator

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; BIOSENSORS; CHEMICAL SENSORS; COATING TECHNIQUES; ELASTIC MODULI; ELECTRIC ADMITTANCE; ELECTRIC IMPEDANCE; QUARTZ; RESONATORS; THIN FILMS; VISCOELASTICITY;

THICKNESS SHEAR MODE (TSM);

POLYMETHYL METHACRYLATES;

EID: 0036441944     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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