Model based regression test reduction using dependence analysis

Conference on Software Maintenance

Volumn , Issue , 2002, Pages 214-223

  Korel, Bogdan ^a   Tahat, Luay H ^b   Vaysburg, Boris ^a  

^a Illinois Institute of Technology   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; FORMAL LANGUAGES; REGRESSION ANALYSIS; SYSTEMS ENGINEERING;

SELECTIVE TEST GENERATION TECHNIQUES;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 0036441907     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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