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Volumn 70, Issue , 2002, Pages 149-150

1.3 micron VCSEL arrays for telecom applications

Author keywords

[No Author keywords available]

Indexed keywords

COMMUNICATION CHANNELS (INFORMATION THEORY); ELECTRIC CURRENTS; MIRRORS; MOLECULAR BEAM EPITAXY; RELIABILITY; SEMICONDUCTING GALLIUM ARSENIDE; TRANSCEIVERS;

EID: 0036441756     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (4)
  • 4
    • 85069030194 scopus 로고    scopus 로고
    • Oxide VCSEL reliability summary
    • B. Hawthorne, "Oxide VCSEL Reliability Summary", Honeywell, 2001 http://content.honeywell.com/vcsel/pdf/oxidequal.pdf.
    • (2001) Honeywell
    • Hawthorne, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.