Assessment of performance of fringing electric field sensor arrays

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 2002, Pages 918-921

  Mamishev, A V ^a   Takahashi, A R ^b   Du, Y ^c   Lesieutre, B C ^d   Zahn, M ^b  

^a UNIVERSITY OF WASHINGTON   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c UNDERWRITERS LABORATORIES INC   (United States)

^d Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ARRAYS; DIELECTRIC MATERIALS; ELECTRIC FIELDS; ELECTRODES; ERROR ANALYSIS; PARAMETER ESTIMATION;

FRINGING ELECTRIC FIELDS;

SENSORS;

EID: 0036440828     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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2. P.A. von Guggenberg and M.C. Zaretsky, "Estimation of One-Dimensional Complex-Permittivity Profiles: a Feasibility Study," Journal of Electrostatics, vol. 34, no. 2-3, pp. 263-277, Mar. 1995.
3. M.C. Zaretsky, L. Mouayad, and J.R. Melcher, "Continuum Properties From Interdigital Electrode Dielectrometry," IEEE Transactions on Electrical Insulation, vol. 23, no. 6, pp. 897-917, Dec. 1988.
4. N.F. Sheppard, D.R. Day, H.L. Lee, and S.D. Senturia, "Microdielectrometry," Sensors and Actuators, vol. 2, no. 3, pp. 263-274, July 1982.
5. Mamishev, A.V., Zahn, M., Lesieutre, B.C., and Berdnikov, B.A., Influence of Geometric Parameters on Characteristics of an Interdigital Sensor, IEEE Conference on Electrical Insulation and Dielectric Phenomena, 1996, pp. 550-553.
6. "Standard Test Method For Relative Permittivity (Dielectric Constant) and Dissipation Factor Of Polyethylene by Liquid Displacement Procedure (ASTM D1531-81)," 1986.
7. S.D. Senturia, N.F. Sheppard Jr., H.L. Lee, and D.R. Day, "In-Situ Measurement of the Properties of Curing Systems With Microdielectrometry," Journal of Adhesion, vol. 15, no. 69, pp. 69-90, 1982.