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Volumn 70, Issue , 2002, Pages 326-327
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Packaging of micro-optic components to meet Telcordia standards
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRONICS PACKAGING;
FAILURE ANALYSIS;
FINITE ELEMENT METHOD;
JOINTS (STRUCTURAL COMPONENTS);
RELIABILITY;
STANDARDS;
STRESS ANALYSIS;
TELECOMMUNICATION EQUIPMENT;
THERMAL STRESS;
TELECOM PACKAGES;
MICROOPTICS;
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EID: 0036438370
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (3)
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