Hardness and microstructure changes in severely deformed and recrystallized tantalum

TMS Annual Meeting

Volumn , Issue , 2002, Pages 151-160

  Hartwig, K T ^a   Mathaudhu, S N ^a   Maier, H J ^b   Karaman, I ^a  

^a Texas AandM University   (United States)

^b UNIVERSITY OF PADERBORN   (Germany)

Author keywords

ECAE; Microhardness; Microstructure; Nanocrystal line; Recrystallization; Tantalum

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; HIGH TEMPERATURE EFFECTS; MECHANICAL VARIABLES MEASUREMENT; MELTING; METAL EXTRUSION; MICROHARDNESS; RECRYSTALLIZATION (METALLURGY); STRAIN; VACUUM APPLICATIONS;

DENSE DISLOCATION TANGLES; EQUAL CHANNEL ANGULAR EXTRUSION; MICROHARDNESS MEASUREMENT; RECRYSTALLIZATION TEMPERATURE;

TANTALUM;

EID: 0036437497     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/9781118804537.ch18     Document Type: Conference Paper

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