Growth of high frequency SiGe heterojunction bipolar transistors structures

Physica Scripta T

Volumn 101, Issue , 2002, Pages 45-48

  Radamson, H H ^a   Mohadjeri, B ^a,b   Menon, C ^a   Bentzen, A ^a   Grahn, J ^a   Landgren, G ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b Micronic Laser Systems AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; MASS SPECTROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH;

LATTICE MAPPING;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0036437333     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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