Diagnostics of residual stressed state of welded structures using the methods of holographic interferometry and electron speckle-interferometry

Materials Science Forum

Volumn 404-407, Issue , 2002, Pages 867-874

  Lobanov, L ^a   Pivtorak, V ^a  

^a E O PATON ELECTRIC WELDING INSTITUTE   (Ukraine)

Author keywords

Compact holographic device; Electron speckle interferometry; Holographic interferometry; Residual stresses

Indexed keywords

ELECTRONS; HOLOGRAPHIC INTERFEROMETRY; RESIDUAL STRESSES; SPECKLE; STRUCTURAL ANALYSIS;

ELECTRON SPECKLE-INTERFEROMETRY;

WELDS;

EID: 0036432478     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.404-407.867     Document Type: Conference Paper

References (8)

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8. Jones R. and Wykes C. Holographic and Speckle Interferometry», Cambridge University Press, Cambridge, England (1982).