Depth profiling of phase composition and texture in layered-graded Al2O3- & Ti3SiC2- based systems using x-ray and synchrotron radiation diffraction

Key Engineering Materials

Volumn 224-226, Issue , 2002, Pages 505-510

  Low, I M ^a   Singh, M ^a   Manurung, P ^a   Wren, E ^a   Sheppard, D P ^a   Barsoum, M W ^a  

^a CURTIN UNIVERSITY   (Australia)

Author keywords

Depth profiling; Grazing incidence; Layered graded; Synchrotron radiation diffraction

Indexed keywords

ALUMINA; CERAMIC MATERIALS; SYNCHROTRON RADIATION; TEXTURES; TITANIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

DEPTH PROFILING;

PHASE COMPOSITION;

EID: 0036432012     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

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