Fatigue damage mechanism and stress relaxation in shot peened and polished nickel base materials

Materials Science Forum

Volumn 404-407, Issue , 2002, Pages 451-456

  Belassel, M ^a   Brauss, M ^a   Pineault, J ^a   Berkley, S G ^a  

^a Proto Manufacturing Limited   (Canada)

Author keywords

Fatigue; Microcracks; Nickel base alloy; Residual stress; Rotating beam; Stress relaxation

Indexed keywords

COMPRESSIVE STRESS; CRACK PROPAGATION; CYCLIC LOADS; FATIGUE OF MATERIALS; MICROCRACKS; PLASTIC DEFORMATION; RESIDUAL STRESSES; SHAFTS (MACHINE COMPONENTS); SHOT PEENING; STRENGTH OF MATERIALS; STRESS CONCENTRATION; STRESS RELAXATION; TURBINES;

FATIGUE DAMAGE;

NICKEL ALLOYS;

EID: 0036430803     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.404-407.451     Document Type: Conference Paper

References (4)

1. M. Belassel et al., "Residual Stress Relaxation in Nickel Base Alloys Subjected to Low Cycle Fatigue", Proceedings of ICRS6, 10-12 July, 2000, Oxford (UK), pp.144-151.
2. Verpoort C.M. and Gerdes C., 'Shot Peening Theory and Application', IITT-International, 1989, pp. 11-70.
3. Stan Berkley Patents No. U.S. 5,490,195 and 5,625,664.
4. François D., Pineau A. et Zaoui A. 'Comportement Mécanique des Matériaux', Ed. Hermes, 1993.