Measurement of residual stress through a shot peened surface subjected to successive material removal

Materials Science Forum

Volumn 404-407, Issue , 2002, Pages 653-658

  Bonner, N W ^a   Wimpory, R C ^a   Webster, G A ^a   Fry, A T ^a   Kandil, F A ^a  

^a ROLLS ROYCE PLC   (United Kingdom)

Author keywords

Electrochemical polishing; Neutron diffraction; Nickel base superalloy; Residual stresses; Shot peening; X ray diffraction

Indexed keywords

CRACK PROPAGATION; ELECTROLYTIC POLISHING; NEUTRON DIFFRACTION; RESIDUAL STRESSES; SHOT PEENING; X RAY DIFFRACTION;

MATERIAL REMOVAL;

SURFACE TREATMENT;

EID: 0036430747     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.404-407.653     Document Type: Conference Paper

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