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Materials Science Forum

Volumn 403, Issue , 2002, Pages 111-116

Microstructure and magnetic properties of Co films on Si: Thickness and roughness dependence

(4) De Carvalho, H B a Brasil, M J S P a Knobel, M a Cotta, M A a

a UNIVERSITY OF CAMPINAS (Brazil)

Author keywords

Coercivity; Magnetization reversal; Roughness; Thickness; Uniaxial anisotropy

Indexed keywords

ATOMIC FORCE MICROSCOPY; COBALT; MAGNETIC PROPERTIES; MICROSTRUCTURE; OPTICAL KERR EFFECT; POLYCRYSTALLINE MATERIALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

SURFACE MAGNETO-OPTICAL KERR EFFECT (SMOKE);

METALLIC FILMS;

EID: 0036430643 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.403.111 Document Type: Conference Paper

Times cited : (1)

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