Segmentation of the measured point data in reverse engineering

International Journal of Advanced Manufacturing Technology

Volumn 20, Issue 8, 2002, Pages 571-580

  Kim, H C ^a   Hur, S M ^a   Lee, S H ^a  

^a Pusan National University   (South Korea)

Author keywords

Laser scanner; Reverse engineering; Segmentation; STL; Triangular net

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; BOUNDARY CONDITIONS; COMPUTER AIDED DESIGN; COMPUTER AIDED MANUFACTURING; COMPUTER SIMULATION; CURVE FITTING; EDGE DETECTION; IMAGE SEGMENTATION; LASER APPLICATIONS; SCANNING; THREE DIMENSIONAL COMPUTER GRAPHICS;

LASER SCANNER; RAPID PRODUCT DEVELOPMENT; TRIANGULAR NET;

REVERSE ENGINEERING;

EID: 0036429222     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001700200193     Document Type: Article

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