Structural and electrical properties of lanthanum oxide thin films deposited by laser ablation

Applied Surface Science

Volumn 197-198, Issue , 2002, Pages 522-526

  Vignolo, M F ^a   Duhalde, S ^a   Bormioli, M ^a   Quintana, G ^a   Cervera, M ^b   Tocho, J ^b  

^a UNIVERSIDAD DE BUENOS AIRES   (Argentina)

^b UNIVERSIDAD NACIONAL DE LA PLATA   (Argentina)

Author keywords

Gas sensors; Laser ablation; Thin films

Indexed keywords

AMORPHOUS FILMS; CHEMICAL SENSORS; CRYSTALLIZATION; LANTHANUM COMPOUNDS; NITROGEN OXIDES; PULSED LASER DEPOSITION; THICK FILMS;

CRYSTALLIZATION TEMPERATURE;

THIN FILMS;

EID: 0036427449     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00329-X     Document Type: Conference Paper

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