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Volumn 47, Issue 3, 2002, Pages 460-465
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Rietveld analysis of X-ray diffraction pattern from β-Ta2O5 oxide
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036425041
PISSN: 00234761
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (11)
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References (0)
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