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Volumn 4828, Issue , 2002, Pages 116-122

New liquid crystal polymer (LCP) flex circuits to meet demanding reliability and end-use applications requirements

Author keywords

Assembly; High Frequency; LCP; Liquid Crystal Polymer; Moisture Resistance; Reliability; Soldermask

Indexed keywords

ASSEMBLY; DIELECTRIC MATERIALS; ETCHING; LIQUID CRYSTAL POLYMERS; METALLIZING; RELIABILITY; THERMOPLASTICS;

EID: 0036421377     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (14)
  • 1
    • 0040564024 scopus 로고    scopus 로고
    • Flex meeting the cost / performance challenges
    • January-February
    • R.D. Schueller, E.A. Bradley, and P.M. Harvey, "Flex Meeting the Cost / Performance Challenges," Chip Scale Review, Vol. 3, No. 1, pp. 37-43, January-February, 1998.
    • (1998) Chip Scale Review , vol.3 , Issue.1 , pp. 37-43
    • Schueller, R.D.1    Bradley, E.A.2    Harvey, P.M.3
  • 2
    • 0011273194 scopus 로고    scopus 로고
    • Liquid crystal polymers for flexible circuits
    • in press, March
    • R.Yang, "Liquid Crystal Polymers for Flexible Circuits," Advanced Packaging, in press, March 2002.
    • (2002) Advanced Packaging
    • Yang, R.1
  • 6
    • 70349904951 scopus 로고    scopus 로고
    • Accelerated moisture resistance - Unbiased autoclave
    • JESD22-A102-C, December
    • JESD22-A102-C, "Accelerated Moisture Resistance - Unbiased Autoclave," JEDEC Standard, December 2000.
    • (2000) JEDEC Standard
  • 7
    • 0011357983 scopus 로고    scopus 로고
    • Accelerated moisture resistance - Unbiased HAST
    • JESD22-A118, December
    • JESD22-A118, "Accelerated Moisture Resistance - Unbiased HAST," JEDEC Standard, December 2000.
    • (2000) JEDEC Standard
  • 8
    • 0011351329 scopus 로고    scopus 로고
    • Highly accelerated temperature and humidity test (HAST)
    • JESD22-A110-B, February
    • JESD22-A110-B, "Highly Accelerated Temperature and Humidity Test (HAST)," EIA/JEDEC Standard, February 1999.
    • (1999) EIA/JEDEC Standard
  • 9
    • 0011315349 scopus 로고
    • Thermal shock
    • JESD22-A106A, April
    • JESD22-A106A, "Thermal Shock," JEDEC Standard, April 1995.
    • (1995) JEDEC Standard
  • 10
    • 0011344217 scopus 로고    scopus 로고
    • Thermal cycling
    • JESD22-A104-B, July
    • JESD22-A104-B, "Thermal Cycling," JEDEC Standard, July 2000.
    • (2000) JEDEC Standard
  • 14
    • 33746294516 scopus 로고    scopus 로고
    • Liquid crystal polymer film with high heat resistance and high dimensional stability
    • February
    • H. Inoue and S. Fukutake, "Liquid Crystal Polymer Film with High Heat Resistance and High Dimensional Stability, " SMTA Pan Pacific Microelectronics Symposium, February, 2001.
    • (2001) SMTA Pan Pacific Microelectronics Symposium
    • Inoue, H.1    Fukutake, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.