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Volumn 4778, Issue , 2002, Pages
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Interferometry XI: Applications
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CAMERAS;
COMPOSITE MICROMECHANICS;
DATA ACQUISITION;
FLIP CHIP DEVICES;
INTERFEROMETERS;
LIGHT SOURCES;
LIGHTING;
MICROELECTROMECHANICAL DEVICES;
MOIRE FRINGES;
OPTICAL DESIGN;
OPTICAL VARIABLES MEASUREMENT;
OPTOELECTRONIC DEVICES;
PHOTOGRAMMETRY;
PROFILOMETRY;
PROJECTION SYSTEMS;
CHEMICAL SHRINKAGE STRESS;
DIGITAL FRINGE PROJECTIONS;
DIGITAL HOLOGRAPHIC MICROINTERFEROMETERS (DHMI);
DIGITAL HOLOGRAPHY;
EIREV;
FRINGE PATTERN ANALYSIS;
MICROMIRROR DISPLAY DEVICES;
OPTO-ELECTRONIC METROLOGY;
PHASE MEASUREMENT PROFILOMETRY (PMP);
INTERFEROMETRY;
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EID: 0036421196
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (2)
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References (0)
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