Performance and first results of a new 200 kV FEG-EFTEM

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 586-587

  Lang, Günter ^a   Benner, Gerd ^a   Orchowski, Alexander ^a   Rau, Wolf Dieter ^a  

^a LEO Elektronenmikroskopie GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036415307     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602105873     Document Type: Conference Paper

References (4)

1. Benner, G. and Probst, W., Journal of Microscopy, Vol. 174, (1994), 133
2. Benner, G. et al., (2002) Microsc. Microanal., this volume
3. Uhlemann, S. and Haider, M., (2002) Microsc. Microanal., this volume
4. Rose, H. and Krahl, D., Springer Series in Optical Sciences 75, (1994), 42