Application of electron speckle-interferometry for residual stress measurements

Zavodskaya Laboratoriya. Diagnostika Materialov

Volumn 68, Issue 4, 2002, Pages 48-51

  Apal'kov, A A ^a   Odintsev, I N ^a   Razumovskij, I A ^a  

^a NONE

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EID: 0036413346     PISSN: 03214265     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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