Electron range at low energy (Eo < 10 keV): Atomic number dependant?

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 704-705

  Hovington, Pierre ^a   Lagacé, Marin ^a   Drouin, Dominique ^a   Gauvin, Raynald ^a  

^a HYDRO QUÉBEC   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036412217     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602106155     Document Type: Conference Paper

References (10)

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3. Al-Ahmad, K.O., and Watt, D.E., (1983), J.Phys.D : Appl. Phys., 16, pp 2257-67
4. Kanaya, K., and Okayama, S., (1972), J. Phys. D : Appl. Phys., 5, pp. 43-58.
5. Hovington, P. et al., (1997), Scanning Vol. 19, pp. 1-14
6. Tung C.J., et al, (1979), Transactions on Nuclear Science, Vol. NS-26, no 6., p. 4874
7. Young, J.R., (1956), J. Appl. Phys., 27, p. 1
8. Holliday, J.E., and Sternglass, E.J., (1959), J. Appl. Phys., 30, p. 1428.
9. Kanter, H., and Sternglass, E.J., (1962), J. Appl. Phys., Vol. 30, p. 1428
10. This work was supported by Hydro-Quebec Research Institut