EBSD spatial resolution in the SEM when analyzing small grains or deformed material

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 670-671

  Rolland, Pierre ^a   Dicks, Keith Graham ^a   Ravel Chapuis, R ^b  

^a OXFORD INSTRUMENTS PLASMA TECHNOLOGY   (United Kingdom)

^b JEOL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036412133     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602106350     Document Type: Conference Paper

References (1)

1. F.J. Humphreys and J. Brough Microscopy Society of America 1999 Proceedings pages 240-241