High-resolution HAADF STEM of inversion boundaries in SB2O3-doped zinc oxide

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 494-495

  Shiojiri, Makoto ^a   Recnik, Aleksander ^b   Yamazaki, Takashi ^c   Kawasaki, Masahiro ^d   Ceh, Miran ^b   Watanabe, Kazuto ^e  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b Institute of Jozef Stefan   (Slovenia)

^c TOKYO UNIVERSITY OF SCIENCE   (Japan)

^d JEOL USA INC   (United States)

^e TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036412009     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602108063     Document Type: Conference Paper

References (2)

1. A. Recnik et al., J. Am. Ceram. Soc., 84 (2001) 2657.
2. K. Watanabe et al., Phys. Rev. B, 64 (2001) 115432.