The ultimate resolution in aberration-corrected STEM

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 16-17

  Pennycook, S J ^a   Lupini, A R ^a   Nellist, P D ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Nion Co Kirkland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036411822     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602101516     Document Type: Conference Paper

References (7)

1. S. J. Pennycook and D. E. Jesson, Phys Rev Lett, 64 (1990) 938, Ultramicroscopy, 37 (1991) 14.
2. S. J. Pennycook and D. E. Jesson, Phys Rev Lett, 64 (1990) 938, Ultramicroscopy, 37 (1991) 14.
3. P. D. Nellist and S. J. Pennycook, Ultramicroscopy, 78 (1999) 111.
4. D. A. Muller and J. Silcox, Ultramicroscopy, 59 (1995) 195.
5. B. Rafferty and S. J. Pennycook, Ultramicroscopy, 78 (1999) 141.
6. V. W. Maslen and C. J. Rossouw, Philos Mag A,49 (1984) 735.
7. This work was supported by the USDOE under contract DE-AC05-00OR22725 managed by UT-Battelle, LLC.