Atom probe tomography: A technique for nanoscale characterization

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 1126-1127

  Miller, M K ^a   Kenik, E A ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036409033     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602103709     Document Type: Conference Paper

References (3)

1. M.K. Miller, Atom Probe Tomography: Analysis at the Atomic Level, Kluwer Academic/Plenum, New York, 2000.
2. J.M. Hyde, D. Phil thesis, University of Oxford, Oxford, UK, 1993.
3. Research at the Oak Ridge National Laboratory SHaRE Collaborative Research Center was sponsored by the Laboratory Directed Research and Development Program and the Division of Materials Sciences and Engineering, U.S. Department of Energy, under contract DE-AC05-00OR22725 with UT-Battelle, LLC.