Comparison of FIB TEM specimen preparation methods

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 44-45

  Anderson, Ronald M ^a  

^a Microscopy Today ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036408988     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760202113X     Document Type: Conference Paper

References (3)

1. Kirk EC et al. (1989) Inst. Phys. Conf. Series, 100, p 501.
2. th Int. Cong. on Electron Microscopy, Cancun, Mexico.
3. Overwijk MHF et al. (1993) J. Vac. Sci. Technol. B 11(6), pp. 2021-2024.