Advances in dual beam TEM sample preparation

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 60-61

  Moore, M V ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036408946     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602101620     Document Type: Conference Paper

References (3)

1. R.J. Young, Microsc. Microanal. 6 (Suppl. 2) (2000) 512.
2. R.J. Young et al., Proc. ISTFA (1998) 329.
3. The author gratefully acknowledges assistance of FEI colleagues Sean Da, Jay Jordan, YC Wang and Richard Young, and collaboration with C. Kisielowski of LBL and S. Rozeveld and E.Beach of DOW Chemical. SiLK is a trademark of the DOW Chemical Company.