Low frequency noise of tantalum capacitors

Active and Passive Electronic Components

Volumn 25, Issue 2, 2002, Pages 161-167

  Sikula, J ^a   Hlavka, J ^a   Pavelka, J ^a   Sedlakova, V ^a   Grmela, L ^a   Tacano, M ^b   Hashiguchi, S ^c  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^b MEISEI UNIVERSITY   (Japan)

^c UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

Noise in tantalum capacitors; Tantalum capacitors

Indexed keywords

AMORPHOUS FILMS; CHARGE CARRIERS; EQUIVALENT CIRCUITS; FREQUENCIES; KINETIC THEORY; LEAKAGE CURRENTS; MANGANESE COMPOUNDS; MIS DEVICES; RELIABILITY; SPURIOUS SIGNAL NOISE; TANTALUM; TRANSPORT PROPERTIES;

CHARGE CARRIER TRANSPORT MECHANISM ANALYSIS; NOISE RELIABILITY INDICATOR; NOISE SPECTRAL DENSITY; TANTALUM CAPACITOR;

CAPACITORS;

EID: 0036406831     PISSN: 08827516     EISSN: None     Source Type: Journal    
DOI: 10.1080/08827510212341     Document Type: Article

References (4)

1. Mead, C. A. (1962). Phys. Rev., 128, 2088.
2. Sze, S. M. (1981). Physics of Semiconductor Devices. J. Wiley & Sons, NY.
3. Sikula, J., et al. (1999). Low frequency noise of thin insulating films. Proceedings of Int. Conf On Noise in Physical Systems and I/f Fluctuations, Hong-Kong, 26 August.
4. Hajek, K., et al. (2001). Extra low noise amplifier for automatic noise spectral density measurements. Proc. of Int. Workshop on Noise and Non-linearity Testing, Brno, 12-13 September.