Nanostructure carbon black - Polyisoprene composites as prospective strain sensor materials: Macro- and nanoscale studies

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4627, Issue 1, 2002, Pages 113-117

  Knite, Maris ^a   Teteris, Valdis ^a   Klemenoks, Igors ^a   Polyakovs, Boris ^b   Erts, Donats ^b  

^a RIGA TECHNICAL UNIVERSITY   (Latvia)

^b UNIVERSITY OF LATVIA   (Latvia)

Author keywords

Atomic force microscopy; Electro conductive polymer nanocomposite; Reversible tensoresistive effect; Sensor material

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON BLACK; DEFORMATION; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; NONMETALLIC MATRIX COMPOSITES; POLYISOPRENES; SENSORS; STRAIN; TENSILE TESTING;

STRAIN SENSORS;

NANOSTRUCTURED MATERIALS;

EID: 0036406722     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.456254     Document Type: Article

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