Micromachining and material change characterization using femtosecond laser oscillators

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4633, Issue , 2002, Pages 112-118

  Schaffer, Chris B ^a   Der Au, Juerg Aus ^a   Squier, Jeff A ^a   Mazur, Eric ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b HARVARD UNIVERSITY   (United States)

Author keywords

Laser micromachining; Laser induced breakdown; Laser induced damage; Nonlinear microscopy; Third harmonic generation; Waveguide writing

Indexed keywords

HARMONIC GENERATION; LASER DAMAGE; MICROMACHINING; MICROSCOPIC EXAMINATION; OPTICAL WAVEGUIDES; OSCILLATORS (ELECTRONIC); REFRACTIVE INDEX;

THIRD HARMONIC GENERATION (THG) MICROSCOPY;

LASER PULSES;

EID: 0036405182     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.461370     Document Type: Article

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