Vicarious calibration and validation in the thermal region

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4538, Issue , 2002, Pages 189-196

  Richter, R ^a   Coll, C ^b   Caselles, V ^b   Rubio, E ^b   Valor, E ^b  

^a GERMAN AEROSPACE CENTER DLR   (Germany)

^b UNIVERSITY OF VALENCIA   (Spain)

Author keywords

DAIS; Vicarious thermal calibration

Indexed keywords

ATMOSPHERICS; CALIBRATION; SPECTROMETERS; THERMAL EFFECTS;

SURFACE TEMPERATURES; THERMAL CHANNELS;

IMAGING TECHNIQUES;

EID: 0036398244     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.454406     Document Type: Article

References (5)

1. Richter, R., Müller, A., and Heiden, U., "Vicarious calibration of imaging spectrometers in the reflective region", ESA WPP-182, ESA-ESTEC (2001).
2. Coll, C., Caselles, V., Rubio, E., Sospedra, F., and Valor, E., Temperature and emissivity separation from calibrated data of the Digital Airborne Imaging Spectrometer, Remote Sensing of the Atmosphere, 76, 250-259 (2000).
3. Kahle, A.B., Madura, D.P., and Soha, J.M., "Middle infrared multispectral aircraft scanner data analysis for geological applications", Applied Optics 19, 2279-2290 (1980).
4. Coll, C., Richter, R., Caselles, V., Rubio, E., and Valor, E., "Vicarious calibration and validation of DAIS thermal channels", ESA WPP-182, ESA-ESTEC (2001).
5. Salisbury, J.W., and D'Aria, D.M., "Emissivities of terrestrial materials in the 8-14 μm amospheric window" Remote Sensing Environment, 42, 83-106 (1992).