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Volumn , Issue , 2002, Pages 602-605

Analysis on dynamic dielectric recovery and statistical property of vacuum circuit-breakers with multi-breaks

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; RESONANT CIRCUITS; SHORT CIRCUIT CURRENTS; STATISTICAL METHODS; VACUUM APPLICATIONS;

EID: 0036397658     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 0026187713 scopus 로고    scopus 로고
    • The development of a vacuum interrupter retrofit for the upgrading and life extension of 121kV-145kV OCB's[J]
    • Slade P G et al., The development of a vacuum interrupter retrofit for the upgrading and life extension of 121kV-145kV OCB's[J], IEEE Trans.on Power Delivery, 1996, Vol.6(3): 1124-1130
    • (1996) IEEE Trans.on Power Delivery , vol.6 , Issue.3 , pp. 1124-1130
    • Slade, P.G.1
  • 3
    • 0031208119 scopus 로고    scopus 로고
    • Simulation of reignition processes of vacuum circuit breakers in series[J]
    • T. Betz, D. Koenig. Simulation of reignition processes of vacuum circuit breakers in series[J]. IEEE Trans.on Dielect. and Elect. Insul., 1997, Vol.4(4):.370-373.
    • (1997) IEEE Trans.on Dielect. and Elect. Insul. , vol.4 , Issue.4 , pp. 370-373
    • Betz, T.1    Koenig, D.2
  • 4
    • 0035248712 scopus 로고    scopus 로고
    • Dielectric strength of double and single-break vacuum interrupters[J]
    • S. Giere, H.C. Karner, Dielectric strength of double and single-break vacuum interrupters[J], IEEE Trans.on Dielect. and Elect. Insul., 2001, Vol.8(1):43-47
    • (2001) IEEE Trans.on Dielect. and Elect. Insul. , vol.8 , Issue.1 , pp. 43-47
    • Giere, S.1    Karner, H.C.2
  • 5
    • 0038252379 scopus 로고
    • Statistical analysis of breakdown property between electrode and shied in high voltage vacuum interrupters[J]
    • H. Toya, T. Hayashi, et al., Statistical analysis of breakdown property between electrode and shied in high voltage vacuum interrupters[J] ,etz Archiv Bd. 7(1985)H.11,pp.363-369
    • (1985) Etz Archiv Bd. , vol.7 , Issue.11 , pp. 363-369
    • Toya, H.1    Hayashi, T.2
  • 6
    • 0038252378 scopus 로고    scopus 로고
    • The research on the statistical breakdown property of high voltage vacuum interrupters under impulse voltage[J]
    • (in Chinese)
    • He junjia, Zou jiyan, The research on the statistical breakdown property of high voltage vacuum interrupters under impulse voltage[J] (in Chinese), Proc. of the CSEE, 1996, Vol.16(5):312-314
    • Proc. of the CSEE, 1996 , vol.16 , Issue.5 , pp. 312-314
    • Junjia, H.1    Jiyan, Z.2
  • 9
    • 0022797595 scopus 로고
    • Evolution of copper vapor from the cathode of a diffuse vacuum arc[J]
    • Lins G, Evolution of copper vapor from the cathode of a diffuse vacuum arc[J], IEEE Trans. on Plasma Sci., 1987, Vol.15(5):552-556.
    • (1987) IEEE Trans. on Plasma Sci. , vol.15 , Issue.5 , pp. 552-556
    • Lins, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.