3D finite element simulation and synthetic tests of vacuum interrupters with axial magnetic field contacts

International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV

Volumn , Issue , 2002, Pages 463-466

  Henon, A ^a   Altimani, T ^a   Picot, P ^a   Schellekens, H ^a  

^a Schneider Electric   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC COILS; ELECTRIC CONTACTS; FINITE ELEMENT METHOD; MAGNETIC FIELD EFFECTS; THREE DIMENSIONAL; VACUUM APPLICATIONS;

AXIAL MAGNETIC FIELD CONTACTS; MAGNETIC FIELD STRENGTH; THREE DIMENSIONAL FINITE ELEMENT SIMULATION; VACUUM INTERRUPTERS;

ELECTRIC CIRCUIT BREAKERS;

EID: 0036397638     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. B. Fenski, M. Lindmayer, Proc. 17th ISDEIV, p. 337, 1996
2. B. Fenski, M. Lindmayer, M. Heimbach, W. Shang, Proc. 18th ISDEIV, p. 459, 1998
3. K. Nitta, K. Watanabe, K. Kagenaga, T. Mori, E. Kaneko, H. Somei, H. Takahashi, IEEE Trans. On Power Delivery, Vol. 12, No. 4, p. 1520, 1997
4. Y. Matsui, H. Takebuchi, M. Sakaki, A. Nishijima, M. Takura, Y. Noda, Proc. 19th ISDEIV, p. 447, 2000
5. P. N. Stoving, E.F. Bestel, Proc. 18th ISDEIV, p. 522, 1998
6. B. Fenski, M. Heimbach, W. Shang, Proc. 19th ISDEIV, p. 451, 2000
7. H. Fink, M. Heimbach, W. Shang, Proc. 19th ISDEIV, p. 375, 2000
8. S. Yanabu, M. Okawa, E. Kaneko, T. Tamagawa, Proc. 12th ISDEIV, p. 186, 1986
9. M. B. Schulman, J.A. Bindas, IEEE Trans. On Comp., Packaging, and Manufacturing Techn., Vol. 17, No. 1, p. 53, 1994
10. IEC 60060-1 (1989-11), "High-voltage test techniques", p. 91