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Surface and Coatings Technology

Volumn 158-159, Issue , 2002, Pages 669-673

Surface mechanical effects of nitrogen ion implantation on vanadium alloys

(13) Garcia J A a Sanchez R a Martinez R a Medrano, A a Rico, M a Rodriguez R a Varela, M b Colera, I b Caceres D b Vergara, I b Ballesteros, C b Roman E c De Segovia, J L c

a AIN (Spain)

b UNIVERSIDAD CARLOS III DE MADRID (Spain)

c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID (Spain)

Author keywords

Auger electron spectroscopy; Hardness; Ion implantation; Vanadium; X ray photoelectron spectroscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; MICROHARDNESS; NITROGEN; VANADIUM ALLOYS; X RAY PHOTOELECTRON SPECTROSCOPY;

FLAT PROFILES;

ION IMPLANTATION;

CORROSION RESISTANCE; HARDNESS; ION IMPLANTATION; MECHANICAL PROPERTY; VANADIUM ALLOY; WEAR RESISTANCE;

EID: 0036395993 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/S0257-8972(02)00239-6 Document Type: Article

Times cited : (15)

References (14)

1
- 0029389353
- (1995) Thin Solid Films , vol.266 , pp. 245
- Torregrosa, F.¹ Barrallier, L.² Roux, L.³

2
- 0032762378
- (1999) Vacuum , vol.52 , pp. 187
- Rodríguez, R.J.¹ Sanz, A.² Medrano, A.³ García, J.A.⁴

3
- 0036136189
- (2002) Vacuum , vol.64 , pp. 343-351
- García, J.A.¹ Guétte, A.² Medrano, A.³ Labrugére, C.⁴ Sánchez, R.⁵ Lahaye, M.⁶ Martínez, A.⁷ Rodríguez, R.J.⁸

4
- 0028517192
- (1994) Vacuum , vol.45 , pp. 1007
- Román, E.¹ de Segovia, J.L.² Rodríguez, R.J.³

5
- 0031546185
- (1997) Nucl. Instr. Meth , vol.121 B , pp. 340
- Miyagawa, Y.¹ Nakao, S.² Ikeyama, M.³ Saitoh, K.⁴ Miyagawa, S.⁵

6
- 0031547789
- (1997) Nucl. Instr. Meth , vol.127 B , Issue.128 , pp. 660
- Fujihana, T.¹ Okabe, Y.² Iwaki, M.³

7
- 0033513809
- (1999) Nucl. Instr. Meth , vol.148 B , pp. 824
- Pelletier, H.¹ Mille, P.² Cornet, A.³ Grob, J.J.⁴ Stoquert, J.P.⁵ Muller, D.⁶

8
- 0000837780
- (1989) J. Electron Spectrosc. Relat. Phenom , vol.49 , pp. 303
- Badrinarayanan, S.¹ Sinha, S.² Mandale, A.B.³

9
- 0000825528
- (1997) J. Phys. Condens. Matter , vol.9 , pp. 8453
- Guemmaz, M.¹ Moraitis, G.² Mosser, A.³ Khan, M.A.⁴ Parlebas, J.C.⁵

10
- 0022237390
- (1986) Micr. Techn. Mater. Sci. Eng. ASTM STP , vol.889 , pp. 72
- Loubet, J.L.¹ Georges, J.M.² Meille, G.³

11
- 0003708258
- second ed., Physical Electronics, Eden Prairie, MN
- (1976) Handbook of Auger Electron Spectroscopy
- Davis, L.E.¹ MacDonald, N.C.² Palmberg, P.W.³ Riach, G.E.⁴ Weber, R.E.⁵

12
- 0029358078
- (1995) Vacuum , vol.46 , pp. 1031
- Román, E.¹ deSegovia, J.L.² Rodríguez, R.J.³ Sanz, A.⁴

13
- 0031369010
- (1997) Surf. Coat. Technol , vol.97 , pp. 499
- García, J.A.¹ Viviente, J.L.² Alonso, F.³ Loinaz, A.⁴ Onate, J.I.⁵

14
- 0003715129
- US Department of Commerce
- (1997) NIST X-ray Photoelectron Spectroscopy Database

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