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Volumn , Issue , 2002, Pages 210-212

A test processor concept for systems-on-a-chip

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED SYSTEMS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; REDUCED INSTRUCTION SET COMPUTING; SHIFT REGISTERS; SIGNAL FILTERING AND PREDICTION;

EID: 0036395308     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 1
    • 0032636437 scopus 로고    scopus 로고
    • Testing the moster chip
    • July
    • Y Zorian, "Testing the Moster Chip", IEEE Spectrum Vol. 36 (7), July 1999, pp. 54-60
    • (1999) IEEE Spectrum , vol.36 , Issue.7 , pp. 54-60
    • Zorian, Y.1
  • 3
    • 0031367231 scopus 로고    scopus 로고
    • Test requirements for embedded core-based systems and IEEE P 1500
    • Y. Zorian, "Test Requirements for Embedded Core-Based systems and IEEE P 1500", Proc. IEEE ITC, Nov 1997, pp. 565-570
    • Proc. IEEE ITC, Nov 1997 , pp. 565-570
    • Zorian, Y.1
  • 7
    • 0029252184 scopus 로고
    • Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift register
    • Febr
    • S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, B. Courtois: "Built-in Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Register", IEEE Transactions on Computers, Vol. 44, No. 2, Febr. 1995, pp. 223-233
    • (1995) IEEE Transactions on Computers , vol.44 , Issue.2 , pp. 223-233
    • Hellebrand, S.1    Rajski, J.2    Tarnick, S.3    Venkataraman, S.4    Courtois, B.5
  • 8
    • 0002446741 scopus 로고    scopus 로고
    • LFSR-coded test patterns for scan design
    • Koemann, B. "LFSR-Coded Test patterns for Scan Design", Proc. IEEE ITC, 1991, pp. 237-242
    • Proc. IEEE ITC, 1991 , pp. 237-242
    • Koemann, B.1
  • 10
    • 0033352144 scopus 로고    scopus 로고
    • An efficient on-line-test and back-up scheme for embedded processors
    • M. Pflanz, F. Pompsch, H.T. Vierhaus: "An Efficient On-Line-Test and Back-up Scheme for Embedded Processors", Proc. IEEE ITC, Sep. 1999, pp. 964-972
    • Proc. IEEE ITC, Sep. 1999 , pp. 964-972
    • Pflanz, M.1    Pompsch, F.2    Vierhaus, H.T.3
  • 11
    • 0004302191 scopus 로고
    • Computer architecture. A quantitative approach
    • Morgan Kaufmann Publishers
    • J. Hennessy, D. Patterson: "Computer Architecture. A Quantitative Approach", Morgan Kaufmann Publishers, 1990
    • (1990)
    • Hennessy, J.1    Patterson, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.