-
1
-
-
0032636437
-
Testing the moster chip
-
July
-
Y Zorian, "Testing the Moster Chip", IEEE Spectrum Vol. 36 (7), July 1999, pp. 54-60
-
(1999)
IEEE Spectrum
, vol.36
, Issue.7
, pp. 54-60
-
-
Zorian, Y.1
-
2
-
-
0032306079
-
Testing embedded core-based system chips
-
Y-. Zorian, E. J. Marinissen, S-. Dey, "Testing Embedded Core-Based System Chips", Proc. IEEE ITC, Oct. 1998, pp. 191-199
-
Proc. IEEE ITC, Oct. 1998
, pp. 191-199
-
-
Zorian, Y.1
Marinissen, E.J.2
Dey, S.3
-
3
-
-
0031367231
-
Test requirements for embedded core-based systems and IEEE P 1500
-
Y. Zorian, "Test Requirements for Embedded Core-Based systems and IEEE P 1500", Proc. IEEE ITC, Nov 1997, pp. 565-570
-
Proc. IEEE ITC, Nov 1997
, pp. 565-570
-
-
Zorian, Y.1
-
4
-
-
47849086126
-
Circuit partitioning for efficient logic BIST synthesis
-
A. Irion, G. Kiefer, H. Vranken, H.-J. Wunderlich, "Circuit Partitioning for Efficient Logic BIST Synthesis", Proc. IEEE DATE, Mar. 2001, pp. 86-91
-
Proc. IEEE DATE, Mar. 2001
, pp. 86-91
-
-
Irion, A.1
Kiefer, G.2
Vranken, H.3
Wunderlich, H.-J.4
-
7
-
-
0029252184
-
Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift register
-
Febr
-
S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, B. Courtois: "Built-in Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Register", IEEE Transactions on Computers, Vol. 44, No. 2, Febr. 1995, pp. 223-233
-
(1995)
IEEE Transactions on Computers
, vol.44
, Issue.2
, pp. 223-233
-
-
Hellebrand, S.1
Rajski, J.2
Tarnick, S.3
Venkataraman, S.4
Courtois, B.5
-
8
-
-
0002446741
-
LFSR-coded test patterns for scan design
-
Koemann, B. "LFSR-Coded Test patterns for Scan Design", Proc. IEEE ITC, 1991, pp. 237-242
-
Proc. IEEE ITC, 1991
, pp. 237-242
-
-
Koemann, B.1
-
9
-
-
0030422467
-
Mixed mode BIST using embedded processors
-
S. Hellebrand, H. J. Wunderlich, A. Hertwig: "Mixed Mode BIST Using Embedded Processors", Proc. IEEE ITC, Oct. 1996, pp. 195-204
-
Proc. IEEE ITC, Oct. 1996
, pp. 195-204
-
-
Hellebrand, S.1
Wunderlich, H.J.2
Hertwig, A.3
-
10
-
-
0033352144
-
An efficient on-line-test and back-up scheme for embedded processors
-
M. Pflanz, F. Pompsch, H.T. Vierhaus: "An Efficient On-Line-Test and Back-up Scheme for Embedded Processors", Proc. IEEE ITC, Sep. 1999, pp. 964-972
-
Proc. IEEE ITC, Sep. 1999
, pp. 964-972
-
-
Pflanz, M.1
Pompsch, F.2
Vierhaus, H.T.3
-
11
-
-
0004302191
-
Computer architecture. A quantitative approach
-
Morgan Kaufmann Publishers
-
J. Hennessy, D. Patterson: "Computer Architecture. A Quantitative Approach", Morgan Kaufmann Publishers, 1990
-
(1990)
-
-
Hennessy, J.1
Patterson, D.2
-
12
-
-
0018809824
-
Built-in logic block observation techniques
-
B. Koenemann, J. Mucha, G. Zwiehoff: "Built-in Logic Block Observation Techniques", Proc. IEEE ITC, 1979, pp. 37-41
-
Proc. IEEE ITC, 1979
, pp. 37-41
-
-
Koenemann, B.1
Mucha, J.2
Zwiehoff, G.3
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