SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Surface and Coatings Technology

Volumn 158-159, Issue , 2002, Pages 214-218

Electronic-loss induced ion beam mixing in various materials studied using SIMS technique

(5) Sinha, S K a Kothari, D C a Balmuragan, A K b Tyagi, A K b Kanjilal, D c

a UNIVERSITY OF MUMBAI (India)

b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH (India)

c INTER UNIVERSITY ACCELERATOR CENTRE (India)

Author keywords

Electronic loss; Ion beam mixing; SIMS

Indexed keywords

DIFFUSION; IONS; IRRADIATION; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; SILICON; THIN FILMS; TITANIUM;

ELECTRONIC LOSSES; ION IRRADIATION;

ION BEAMS;

NITRIDING;

EID: 0036394275 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/S0257-8972(02)00210-4 Document Type: Article

Times cited : (11)

References (19)

1
- 2142665104
- (1990) Mater. Sci. Rep , vol.5 , pp. 45
- Chang, T.Y.¹

2
- 58149212955
- (1995) Nucl. Instrum. Methods B , vol.100 , pp. 191
- Mathre, U.R.¹ Kale, A.N.² Kothari, D.C.³ Sundararaman, M.⁴ Banrjee, S.⁵ Kanjilal, D.⁶

3
- 0000424859
- (1986) Phys. Rev. Lett , vol.57 , pp. 850
- Hou, M.-D.¹ Klaumunzer, S.² Schumacher, G.³

4
- 4243931973
- (1990) Phys. Rev. B , vol.41 , pp. 1144
- Hou, M.-D.¹ Klaumunzer, S.² Schumacher, G.³

5
- 0024640624
- (1989) Nucl. Instrum. Methods B , vol.36 , pp. 412
- Dunlop, A.¹ Lesueur, D.² Jaskierowicz, G.³ Schildknecht, J.⁴

6
- 0000982190
- (1993) Phil. Mag. Lett. A , vol.67 , pp. 256
- Dammak, A.¹ Barbu, A.² Dunlop, A.³ Lesueur, D.⁴ Lorenzolli, N.⁵

7
- 0000424859
- (1986) Phys. Rev. Lett , vol.57 , pp. 850
- Klaumunzer, S.¹ Hou, M.-D.² Schumacher, G.³

8
- 70349771093
- (1993) Europhys. Lett , vol.21 , Issue.6 , pp. 671
- Dufour, C.¹ Bauer, P.² Marchal, G.³

9
- 0033513874
- (1999) Nucl. Instrum. Method B , vol.148 , pp. 176
- Jaouen, C.¹ Michel, A.² Pacaud, J.³ Dufour, C.⁴ Bauer, Ph.⁵ Gervais, B.⁶

10
- 2642547191
- (1997) J. Appl. Phys , vol.81 , Issue.1 , pp. 116
- Bauer, Ph.¹ Dufour, C.² Jaouen, C.³

11
- 0032635150
- (1999) Nucl. Instrum. Methods B , vol.156 , pp. 148
- Dhuri, P.¹ Gupta, A.² Chaudhari, S.M.³ Phase, D.M.⁴ Avasthi, D.K.⁵

12
- 0032653735
- (1999) Nucl. Instrum. Methods B , vol.156 , pp. 143
- Avasthi, D.K.¹ Assmann, W.² Nolte, H.³

13
- 0028481138
- (1994) J. Phys. Condens. Matter , vol.6 , Issue.1 , pp. 6733
- Wang, Z.G.¹ Dufour, Ch.² Paumier, E.³ Toulemonde, M.⁴

14
- 4243175212
- (1993) Rad. Eff. Def. Solids , vol.126 , pp. 123
- Dunlop, A.¹ Lesueur, D.²

15
- 0000235265
- (1980) Nucl. Instrum. Methods , vol.174 , pp. 257
- Biersack, J.P.¹ Haggmark, L.G.²

16
- 0003698310
- Wiley. New York
- (1989) Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis
- Wilson, R.G.¹ Stevie, F.A.² Magee, C.W.³

17
- 0033339161
- (1999) Nucl. Instrum. Methods B , vol.159 , pp. 227
- Sinha, S.K.¹ Kothari, D.C.² Som, T.³ Kulkarmi, V.N.⁴ Panchapakesan, S.⁵ Nair, K.G.M.⁶

18
- 0001018430
- (1973) Surf. Sci , vol.36 , pp. 817
- Shimizu, H.¹ Ono, M.² Nakayama, K.³

19
- 0031546573
- (1997) Nucl. Instrum. Methods B , vol.122 , pp. 481
- Leguay, R.¹ Dunlop, A.² Dunstetter, F.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.