Material characterization using a quasi-optical measurement system

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2002, Pages 104-105

  Gagnon, Nicolas ^a   Shaker, Jafar ^a   Berini, Pierre ^a   Roy, Langis ^a   Petosa, Aldo ^a  

^a Radio Science Branch   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DIELECTRIC MATERIALS; ERROR CORRECTION; MATRIX ALGEBRA; PARAMETER ESTIMATION; SCATTERING PARAMETERS;

MATERIAL CHARACTERIZATION; QUASI-OPTICAL MEASUREMENT SYSTEM; SCATTERING MATRIX;

OPTICAL VARIABLES MEASUREMENT;

EID: 0036393654     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. M. Le Goff, J.L. Le Bras, B. Deschamps, D. Rozuel, D. Bourreau, and A. Péden, "Ka Band Quasi Optical Test Bench Using Focusing Horns," in Proc. 29th European Microwave Conf., Munich, Germany, Vol. 2, pp. 240-243, 1999.
2. D.K. Ghodgaonkar, V.V. Varadan, and V.K. Varadan, "Free-Space Measurement of Complex Permittivity and Complex Permeability of Magnetic Materials at Microwave Frequencies," IEEE Trans. Instrum. Meas., Vol. 39, No. 2 pp. 387-394, April 1990.
3. J. Baker-Jarvis, E.J Vanzura, and W.A. Kissick, "Improved Technique for Determining Complex Permittivity with the Transmission/Reflection Method," IEEE Trans. Microwave Theory Tech., Vol. 38, No. 8, pp. 1096-1103, August 1990.