Quantum resistance standards with double 2DEG

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2002, Pages 240-241

  Bounouh, A ^a   Poirier, W ^a   Piquemal, F ^a   Geneves G ^a   Andre J P ^a  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC NETWORK ANALYSIS; MAGNETIC FIELDS; OHMIC CONTACTS; SEMICONDUCTOR QUANTUM WELLS; STANDARDS;

QUANTUM RESISTANCE STANDARDS; TWO-DIMENSIONAL ELECTRON GASES;

HALL EFFECT;

EID: 0036393571     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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2. G. S. Boebinger, H. W; Jaing, L. N. Pfeiffer and K; W; West, Phys. Rev. Lett. 64, 1793 (1990)
3. Y. Ohno, H. Sakaki and M. Tsuchiya, Phys. Rev. B 49, 11492 (1994)
4. W. Poirier, K. Hayashi, H. Fhima, F. Piquemal, G. Genevès, J. P. André, "QHE array resistance standards down to 129 Ω", in CPEM2000 Conference Digest, pp. 517 (2000).
5. W. Poirier, K. Hayashi, A. Bounouh, H. Fhima, F. Piquemal, G. Genevè, J. P. André "Development of QHE Devices array resistance standards", Compte rendu CCEM2001.
6. F. Delahaye et al, Compte rendu CCE, Appendix E4, pp. E119-E129 (1988).