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Volumn 4217, Issue , 2002, Pages 196-201

Design-oriented measurement-based scaleable models for multilayer MCM-D integrated passives, implementation in a design library offering automated layout

Author keywords

Coplanar waveguide; Design library; MCM D; Resistor; Spiral inductor

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC INDUCTORS; ELECTRIC RESISTANCE; LUMPED PARAMETER NETWORKS; MULTILAYERS; RESISTORS; WAVEGUIDES;

EID: 0036391906     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (5)
  • 3
    • 0032644106 scopus 로고    scopus 로고
    • Characterizing differences between measurement and calibration wafer in probe-tip calibrations
    • G. Carchon, B. Nauwelaers, W. De Raedt, D. Schreurs, and S. Vandenberghe, "Characterizing differences between measurement and calibration wafer in probe-tip calibrations," Electronics Letters, vol. 35, pp. 1087-1088, 1999.
    • (1999) Electronics Letters , vol.35 , pp. 1087-1088
    • Carchon, G.1    Nauwelaers, B.2    De Raedt, W.3    Schreurs, D.4    Vandenberghe, S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.