Electron-trapping probability in natural dosemeters as a function of irradiation temperature

Radiation Protection Dosimetry

Volumn 101, Issue 1-4, 2002, Pages 339-344

  Wallinga, J ^a,b   Murray, A S ^a   Wintle, A G ^c   Botter Jensen L ^d   Horowitz, Y S ^e   Oster, L ^e  

^a AARHUS UNIVERSITY   (Denmark)

^b UTRECHT UNIVERSITY   (Netherlands)

^c ABERYSTWYTH UNIVERSITY   (United Kingdom)

^d TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^e NONE

Author keywords

[No Author keywords available]

Indexed keywords

MINERAL; SILICON DIOXIDE;

ANALYTIC METHOD; ANALYTICAL ERROR; ANALYTICAL PARAMETERS; ARTICLE; CONTROLLED STUDY; DOSIMETER; DOSIMETRY; ELECTRON CAPTURE DETECTION; ENVIRONMENTAL FACTOR; ENVIRONMENTAL TEMPERATURE; IRRADIATION; LABORATORY; LUMINESCENCE; OPTICS; PROBABILITY; TEMPERATURE DEPENDENCE;

EID: 0036390708     PISSN: 01448420     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.rpd.a005997     Document Type: Article

References (13)

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9. Wallinga, J., Murray, A. S. and Wintle, A. G. The Single-aliquot Regenerative-dose (SAR) Protocol Applied to Coarse-grain Feldspar. Radiat. Meas. 32, 529-533 (2000).
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