An expert system architecture to detect system-level automotive EMC problems

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2002, Pages 976-981

  Ranganathan, Sreeniwas ^a   Beetner, Daryl G ^a   Wiese, Rich ^b   Hubing, Todd H ^a  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b GENERAL MOTORS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMOTIVE ENGINEERING; EXPERT SYSTEMS; RADIATION; SYSTEMS ENGINEERING;

EXPERT SYSTEM ARCHITECTURE;

ELECTROMAGNETIC COMPATIBILITY;

EID: 0036383572     PISSN: 01901494     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISEMC.2002.1032828     Document Type: Article

References (4)

1. T. Hubing, J. Drewniak, T. Van Doren, and N. Kashyap, "An expert system approach to EMC modeling," Proceedings of the 1996 IEEE International Symposium on Electromagnetic Compatibility, Santa Clara, CA, pp. 200-203, August 1996.
2. T. Hubing, N. Kashyap, J. Drewniak, T. Van Doren, and R. DuBroff, "Expert system algorithms for EMC analysis," Proceedings of the 14th Annual Review of Progress in Applied Computational Electromagnetics, Monterey, CA, pp. 905-910, 1998.
3. N. Kashyap, T. Hubing, J. Drewniak, and T. Van Doren, "An expert system for predicting radiated EMI from PCBs," Proceedings of the 1997 IEEE International Symposium on Electromagnetic Compatibility, Austin, TX, pp. 444-449, August 1997.
4. I.E. Noble, "Electromagnetic compatibility in the automotive environment" Science, Measurement and Technology, IEE proceedings, vol. 141(4), pp. 252-258, 1994.