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Volumn 55, Issue 1-2, 2002, Pages 111-123
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Small sample corrections for LTS and MCD
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Author keywords
Bias; Least Trimmed Squares estimator; Minimum Covariance Determinant estimator; Robustness
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Indexed keywords
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EID: 0036383073
PISSN: 00261335
EISSN: None
Source Type: Journal
DOI: 10.1007/s001840200191 Document Type: Conference Paper |
Times cited : (135)
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References (9)
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