Structural health monitoring using wireless sensing system with embedded processing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4704, Issue , 2002, Pages 215-224

  Tanner, Neal A ^a   Farrar, Charles R ^b   Sohn, Hoon ^b  

^a Stanford University   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Damage detection; MEMS; Statistical pattern recognition; Structural health monitoring; Time series analysis; Wireless sensing

Indexed keywords

DATA PROCESSING; EMBEDDED SYSTEMS; JOINTS (STRUCTURAL COMPONENTS); MICROPROCESSOR CHIPS; REAL TIME SYSTEMS; SENSORS; STATISTICAL PROCESS CONTROL; VIBRATIONS (MECHANICAL);

STRUCTURAL HEALTH MONITORING;

WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 0036380625     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.470728     Document Type: Article

References (4)

1. Doebling, S. W., et al., (1998) "A Review of Damage Identification Methods that Examine Changes in Dynamic Properties, " Shock and Vibration Digest 30 (2), pp. 91-105.
2. Doebling, S. W., et al., (1998) "A Review of Damage Identification Methods that Examine Changes in Dynamic Properties, " Shock and Vibration Digest 30 (2), pp. 91-105.
3. See http://www.xbow.com/
4. Sohn, H., J. Czarnecki, C. Farrar (2000) "Structural Health Monitoring Using Statistical Process Control, " J. of Structural Eng., ASCE, 126 (11), pp. 1356-1363.