Mining long sequential patterns in a noisy environment

Proceedings of the ACM SIGMOD International Conference on Management of Data

Volumn , Issue , 2002, Pages 406-417

  Yang, Jiong ^a   Wang, Wei ^a   Yu, Philip S ^a   Han, Jiawei ^b  

^a IBM   (United States)

^b UIUC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036373130     PISSN: 07308078     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/564736.564738     Document Type: Conference Paper

References (31)