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Volumn 62, Issue 4, 2002, Pages 562-569

Reliability generalization: Moving toward improved understanding and use of score reliability

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EID: 0036354251     PISSN: 00131644     EISSN: None     Source Type: Journal    
DOI: 10.1177/0013164402062004002     Document Type: Article
Times cited : (114)

References (37)
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