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Materials Research Society Symposium - Proceedings

Volumn 703, Issue , 2002, Pages 505-510

Soft reverse current-voltage characteristics in V2O5 nanofiber junctions

(4) Kim, Gyu Tae a Muster, Jörg a Burghard, Marko a Roth, Siegmar a

a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRODES; ELECTRON TUNNELING; SCHOTTKY BARRIER DIODES; THERMIONIC EMISSION; VANADIUM COMPOUNDS;

IDEALITY FACTORS; NANOFIBER JUNCTIONS;

NANOSTRUCTURED MATERIALS;

EID: 0036352464 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (13)

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