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Volumn 691, Issue , 2002, Pages 295-300

Growth of PbTe films by magnetron sputtering

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; FILM GROWTH; GLASS; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETRON SPUTTERING; SILICON WAFERS; SUBSTRATES; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0036352189     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (5)
  • 5
    • 2142754110 scopus 로고
    • Powder diffraction file, JCPDS-ICDD card numbers 38-1435 and 27-1402, International Center for Diffraction Data, Swarthmore, Pa
    • (1991)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.