Microstructure and thermoelectric properties of p-type Bi0.5Sb1.5Te3 and n-type Bi2Te2.7Se0.3 films deposited by pulsed laser ablation

Materials Research Society Symposium - Proceedings

Volumn 691, Issue , 2002, Pages 189-194

  Makala, Raghuveer S ^a   Jagannadham, K ^a   Sales, B C ^a   Wang, Hsin ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ENERGY DISPERSIVE SPECTROSCOPY; LASER ABLATION; NEODYMIUM LASERS; PULSED LASER APPLICATIONS; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; THERMOELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BISMUTH ANTIMONY TELLURIDE; BISMUTH TELLURIUM SELENIDE; PULSED LASER ABLATION;

BISMUTH ALLOYS;

EID: 0036352116     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)