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Volumn 245, Issue 1, 2002, Pages 215-218

Direct measurement of the Laplace pressure in a very thin liquid film

Author keywords

Meniscus force; Nanotechnology; Surface force; The Laplace pressure

Indexed keywords

MECHANICAL ENGINEERING; MICROMETERS; MICROSCOPIC EXAMINATION; PRESSURE EFFECTS;

EID: 0036351440     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcis.2001.7985     Document Type: Article
Times cited : (6)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.