Ion beam deposited GMR materials

Materials Research Society Symposium - Proceedings

Volumn 690, Issue , 2002, Pages 157-162

  Lannon, J M ^a   Pace, C C ^a   Temple, D ^a   McGuire, G E ^a   Hebard, A F ^a   Ray, M ^a  

^a MCNC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CHROMIUM; GIANT MAGNETORESISTANCE; ION BEAM ASSISTED DEPOSITION; IRON; MAGNETIC VARIABLES MEASUREMENT; MONTE CARLO METHODS; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY DISTRIBUTIONS; ION BEAM ENERGY; TRANSPORT OF IONS IN MATTER;

MAGNETIC MATERIALS;

EID: 0036350134     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)